Front cover image for Leakage in nanometer CMOS technologies

Leakage in nanometer CMOS technologies

Covers in detail promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles.
Print Book, English, 2006
Springer, New York, 2006
x, 307 pages : illustrations ; 24 cm
9780387257372, 9780387281339, 0387257373, 0387281339
Taxonomy of Leakage: Sources, Impact, and Solutions.- Leakage Dependence on Input Vector.- Power Gating and Dynamic Voltage Scaling.- Methodologies for Power Gating.- Body Biasing.- Process Variation and Adaptive Design.- Memory Leakage Reduction.- Active Leakage Reduction and Multi-Performance Devices.- Impact of Leakage Power and Variation on Testing.- Case Study: Leakage Reduction in Hitachi/Renesas Microprocessors.- Case Study: Leakage Reduction in the Intel Xscale Microprocessor.- Transistor Design to Reduce Leakage.