Nanoscale electric phenomena at oxide surfaces and interfaces by scanning probe microscopy
Strong coupling between mechanical, electrical and magnetic properties in oxide materials, heterostructures and devices enable their widespread applications. Achieving the full potential of oxide electronics necessitates quantitative knowledge of material and device properties on the nanoscale level. In this thesis, Scanning Probe Microscopy is used to study and quantify the nanoscale electric phenomena in the two classes of oxide systems, namely transport at electroactive grain boundaries and surface behavior of ferroelectric materials
Thesis, Dissertation, English, 2002